Showing results 1 to 20 of 22
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Issue Date | Title | Author(s) |
14-Jan-2014 | The Centre for Accelerator Science at ANSTO | Hotchkis, MAC; Child, DP; Cohen, DD; Dodson, JR; Fink, D; Fujioka, T; Garton, D; Hua, Q; Ionescu, M; Jacobsen, GE; Levchenko, VA; Mifsud, C; Pastuovic, Z; Siegele, R; Smith, AM; Wilcken, KM; Williams, AG |
6-Nov-2018 | Characterisation of anthropogenic radioactive particles from former weapon test sites in Australia | Young, EL; Johansen, MP; Child, DP; Hotchkis, MAC; Howell, NR; Pastuovic, Z; Howard, DL; Palmer, T; Davis, J |
1-Jan-2016 | Charge collection efficiency degradation induced by MeV ions in semiconductor devices: model and experiment | Vittone, E; Pastuovic, Z; Breese, M; Garcia Lopez, J; Jakšić, M; Raisanen, J; Siegele, R; Simon, A; Vizkelethy, G |
Jan-2015 | Comparison of in vivo binding properties of the 18-kDa translocator protein (TSPO) ligands [18F]PBR102 and [18F]PBR111 in a model of excitotoxin-induced neuroinflammation | Callaghan, PD; Wimberley, CA; Rahardjo, GL; Berghofer, PJ; Pham, TQ; Jackson, TW; Zahra, D; Bourdier, T; Wyatt, N; Greguric, I; Howell, NR; Siegele, R; Pastuovic, Z; Mattner, F; Loc'h, C; Grégoire, MC; Katsifis, A |
15-Oct-2011 | Creation of microstructures using heavy ion beam lithography | Varasanec, M; Bogdanović-Radović, I; Pastuovic, Z; Jakšić, M |
25-Jan-2022 | Cultural heritage project at Australian Nuclear Science and Technology Organisation (ANSTO) | Salvemini, F; White, R; Levchenko, VA; Smith, AM; Pastuovic, Z; Stopic, A; Luzin, V; Tobin, MJ; Puskar, L; Howard, DL; Davis, J; Avdeev, M; Gatenby, S; Kim, MJ; Grazzi, F; Sheedy, K; Olsen, SR; Raymond, CA; Lord, C; Richards, C; Bevitt, JJ; Popelka-Filcoff, RS; Lenehan, CE; Ives, S; Dredge, P; Yip, A; Brookhouse, MT; Austin, AG |
13-May-2013 | Developing electronic devices capable of withstanding harsh radiation | Pastuovic, Z; Vittone, E; Siegele, R; Capan, I; Vizkelethy, G; Cohen, DD; Jakšić, M |
15-Oct-2011 | Focused ion beam fabrication and IBIC characterisation of a diamond detector with buried electrodes | Olivero, P; Forneris, J; Jakšić, M; Pastuovic, Z; Picollo, F; Skukan, N; Vittone, E |
1-Aug-2014 | Generation of vacancy cluster-related defects during single MeV silicon ion implantation of silicon | Pastuovic, Z; Capan, I; Siegele, R; Jacimovic, R; Forneris, J; Cohen, DD; Vittone, E |
1-Jul-2019 | Heavy ion PIXE cross sections in Ti, Zn, Nb, Ru and Ta for 4.8–30.0 MeV oxygen and 3.0–12.0 MeV lithium beams | Siegele, R; Cohen, DD; Pastuovic, Z |
1-Nov-2019 | IBIC microscopy – the powerful tool for testing micron – sized sensitive volumes in segmented radiation detectors used in synchrotron microbeam radiation and hadron therapies | Pastuovic, Z; Davis, J; Tran, LT; Paino, JR; Dipuglia, A; James, B; Povoli, M; Kok, A; Perevertaylo, VL; Siegele, R; Prokopovich, DA; Lerch, MLF; Petasecca, M; Rosenfeld, AB; Cohen, DD |
1-Jul-2013 | Investigation of elemental changes in brain tissues following excitotoxic injury | Siegele, R; Howell, NR; Callaghan, PD; Pastuovic, Z |
1-Jul-2013 | Light and heavy ion beam analysis of thin biological sections | Lee, J; Siegele, R; Pastuovic, Z; Hackett, MJ; Hunt, NH; Grau, GE; Cohen, DD; Lay, PA |
15-Oct-2011 | Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottkey diode | Olivero, P; Forneris, J; Gamarra, P; Jakšić, M; Lo Giudice, A; Manfredotti, C; Pastuovic, Z; Skukan, N; Vittone, E |
1-Aug-2014 | A Monte carlo software for the 1-dimensional simulation of IBIC experiments | Forneris, J; Jakšić, M; Pastuovic, Z; Vittone, E |
1-Aug-2017 | The new confocal heavy ion microprobe beamline at ANSTO: the first microprobe resolution tests and applications for elemental imaging and analysis | Pastuovic, Z; Siegele, R; Cohen, DD; Mann, M; Ionescu, M; Button, D; Long, S |
28-Feb-2011 | Probability of divacancy trap production in silicon diodes exposed to focused ion beam irradiation | Pastuovic, Z; Vittone, E; Capan, I; Jakšić, M |
1-Apr-2015 | Radiation hardness of n-type SiC Schottky barrier diodes irradiated with MeV He ion microbeam | Pastuovic, Z; Capan, I; Cohen, DD; Forneris, J; Iwamoto, N; Ohshima, T; Siegele, R; Hoshino, N; Tsuchida, H |
7-Jul-2014 | Radiation hardness of n-type SiC Schottky diodes | Pastuovic, Z; Vittone, E; Siegele, R; Ohshima, T; Iwamoto, N; Forneris, J; Cohen, DD; Capan, I |
1-Jan-2013 | Radiation hardness of single crystal CVD diamond detector tested with MeV energy ions | Zamboni, I; Pastuovic, Z; Jakšić, M |