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Browsing by Author Pastuovic, Z

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Showing results 14 to 22 of 22 < previous 
Issue DateTitleAuthor(s)
15-Oct-2011Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottkey diodeOlivero, P; Forneris, J; Gamarra, P; Jakšić, M; Lo Giudice, A; Manfredotti, C; Pastuovic, Z; Skukan, N; Vittone, E
1-Aug-2014A Monte carlo software for the 1-dimensional simulation of IBIC experimentsForneris, J; Jakšić, M; Pastuovic, Z; Vittone, E
1-Aug-2017The new confocal heavy ion microprobe beamline at ANSTO: the first microprobe resolution tests and applications for elemental imaging and analysisPastuovic, Z; Siegele, R; Cohen, DD; Mann, M; Ionescu, M; Button, D; Long, S
28-Feb-2011Probability of divacancy trap production in silicon diodes exposed to focused ion beam irradiationPastuovic, Z; Vittone, E; Capan, I; Jakšić, M
1-Apr-2015Radiation hardness of n-type SiC Schottky barrier diodes irradiated with MeV He ion microbeamPastuovic, Z; Capan, I; Cohen, DD; Forneris, J; Iwamoto, N; Ohshima, T; Siegele, R; Hoshino, N; Tsuchida, H
7-Jul-2014Radiation hardness of n-type SiC Schottky diodesPastuovic, Z; Vittone, E; Siegele, R; Ohshima, T; Iwamoto, N; Forneris, J; Cohen, DD; Capan, I
1-Jan-2013Radiation hardness of single crystal CVD diamond detector tested with MeV energy ionsZamboni, I; Pastuovic, Z; Jakšić, M
15-Mar-2016SIRIUS - a new 6MV accelerator system for IBA and AMS at ANSTOPastuovic, Z; Button, D; Cohen, DD; Fink, D; Garton, D; Hotchkis, MAC; Ionescu, M; Long, S; Levchenko, VA; Mann, M; Siegele, R; Smith, AM; Wilcken, KM
1-Apr-2016Vacancy-related defects in n-type Si implanted with a rarefied microbeam of accelerated heavy ions in the MeV rangeCapan, I; Pastuovic, Z; Siegele, R; Jacimovic, R
Showing results 14 to 22 of 22 < previous