Browsing by Author Siegele, R

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Issue DateTitleAuthor(s)
23-Mar-2009Electron transport properties of irradiated polyimide thin films in single track regimeMurugaraj, P; Mainwaring, DE; Siegele, R
15-Feb-2012Enhanced biocompatibility of PDMS (polydimethylsiloxane) polymer films by ion irradiationIonescu, M; Winton, BR; Wexler, D; Siegele, R; Deslantes, A; Stelcer, E; Atanacio, AJ; Cohen, DD
Apr-2008Evaluation of specimen preparation techniques for micro-PIXE localisation of elements in hyperaccumulating plantsKachenko, AG; Siegele, R; Bhatia, NP; Singh, B; Ionescu, M
Apr-2008Experimental bremsstrahlung yields for MeV proton bombardment of beryllium and carbonCohen, DD; Stelcer, E; Siegele, R; Ionescu, M; Prior, MJ
1-Jan-2012Fabrication and characterisation of diluted magnetic semiconductors thin films using ion beamsIonescu, M; Photongkam, P; Siegele, R; Deslandes, A; Li, S; Cohen, DD
3-Mar-2021Fingerprinting Australian soils based on their source locationCrawford, J; Cohen, DD; Antancio, AJ; Manohar, M; Siegele, R
1-Nov-2013Formation of energetic heavy ion tracks in polyimide thin filmsDeslandes, A; Murugaraj, P; Mainwaring, DE; Ionescu, M; Cohen, DD; Siegele, R
15-Nov-2021Geant4 x-ray fluorescence with updated librariesBakr, S; Cohen, DD; Siegele, R; Archer, JW; Incerti, S; Ivanchenko, V; Mantero, A; Rosenfeld, AB; Guatelli, S
1-Aug-2014Generation of vacancy cluster-related defects during single MeV silicon ion implantation of siliconPastuovic, Z; Capan, I; Siegele, R; Jacimovic, R; Forneris, J; Cohen, DD; Vittone, E
1-Jul-2019Heavy ion PIXE cross sections in Ti, Zn, Nb, Ru and Ta for 4.8–30.0 MeV oxygen and 3.0–12.0 MeV lithium beamsSiegele, R; Cohen, DD; Pastuovic, Z
Apr-2008Heavy ion ToF analysis of oxygen incorporation in MgB2 thin filmsIonescu, M; Zhao, Y; Siegele, R; Cohen, DD; Stelcer, E; Prior, MJ
Apr-1996High energy, heavy ion nuclear microprobe for ion beam research on the tandem accelerator at ANSTO.Cohen, DD; Siegele, R; Dytlewski, N
15-Apr-2021iBAT: a new ion beam batch analysis tool for thin samplesSiegele, R; Cohen, DD
1-Nov-2019IBIC microscopy – the powerful tool for testing micron – sized sensitive volumes in segmented radiation detectors used in synchrotron microbeam radiation and hadron therapiesPastuovic, Z; Davis, J; Tran, LT; Paino, JR; Dipuglia, A; James, B; Povoli, M; Kok, A; Perevertaylo, VL; Siegele, R; Prokopovich, DA; Lerch, MLF; Petasecca, M; Rosenfeld, AB; Cohen, DD
Dec-2010Improved electromechanical sensitivity of polymer thin films containing carbon clusters produced in situ by irradiation with metal ionsMurugaraj, P; Mainwaring, DE; Khelil, NA; Peng, JL; Siegele, R; Sawant, P
15-Jun-2009Improved resolution and sensitivity on the ANSTO microprobe and it's application to μ-PIXESiegele, R; Kachenko, AG; Ionescu, M; Cohen, DD
25-Nov-2009Improved resolution on the ANSTO microprobe and its applicationSiegele, R; Reinhard, MI; Ionescu, M; Kachenko, AG; Cohen, DD
16-Sep-2013Influence of different mass absorption coefficient datasets on PIXE yieldsSiegele, R; Cohen, DD
1-Jul-2013Investigation of elemental changes in brain tissues following excitotoxic injurySiegele, R; Howell, NR; Callaghan, PD; Pastuovic, Z
15-Oct-2011Investigation of the mouse cerebellum using STIM and mu-PIXE spectrometric and FTIR spectroscopic mapping and imagingHackett, MJ; Siegele, R; El-Assaad, F; McQuillan, JA; Aitken, JB; Carter, EA; Grau, GE; Hunt, NH; Cohen, DD; Lay, PA