Showing results 21 to 40 of 71
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| Issue Date | Title | Author(s) |
| 23-Mar-2009 | Electron transport properties of irradiated polyimide thin films in single track regime | Murugaraj, P; Mainwaring, DE; Siegele, R |
| 15-Feb-2012 | Enhanced biocompatibility of PDMS (polydimethylsiloxane) polymer films by ion irradiation | Ionescu, M; Winton, BR; Wexler, D; Siegele, R; Deslantes, A; Stelcer, E; Atanacio, AJ; Cohen, DD |
| Apr-2008 | Evaluation of specimen preparation techniques for micro-PIXE localisation of elements in hyperaccumulating plants | Kachenko, AG; Siegele, R; Bhatia, NP; Singh, B; Ionescu, M |
| Apr-2008 | Experimental bremsstrahlung yields for MeV proton bombardment of beryllium and carbon | Cohen, DD; Stelcer, E; Siegele, R; Ionescu, M; Prior, MJ |
| 1-Jan-2012 | Fabrication and characterisation of diluted magnetic semiconductors thin films using ion beams | Ionescu, M; Photongkam, P; Siegele, R; Deslandes, A; Li, S; Cohen, DD |
| 3-Mar-2021 | Fingerprinting Australian soils based on their source location | Crawford, J; Cohen, DD; Antancio, AJ; Manohar, M; Siegele, R |
| 1-Nov-2013 | Formation of energetic heavy ion tracks in polyimide thin films | Deslandes, A; Murugaraj, P; Mainwaring, DE; Ionescu, M; Cohen, DD; Siegele, R |
| 15-Nov-2021 | Geant4 x-ray fluorescence with updated libraries | Bakr, S; Cohen, DD; Siegele, R; Archer, JW; Incerti, S; Ivanchenko, V; Mantero, A; Rosenfeld, AB; Guatelli, S |
| 1-Aug-2014 | Generation of vacancy cluster-related defects during single MeV silicon ion implantation of silicon | Pastuovic, Z; Capan, I; Siegele, R; Jacimovic, R; Forneris, J; Cohen, DD; Vittone, E |
| 1-Jul-2019 | Heavy ion PIXE cross sections in Ti, Zn, Nb, Ru and Ta for 4.8–30.0 MeV oxygen and 3.0–12.0 MeV lithium beams | Siegele, R; Cohen, DD; Pastuovic, Z |
| Apr-2008 | Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films | Ionescu, M; Zhao, Y; Siegele, R; Cohen, DD; Stelcer, E; Prior, MJ |
| Apr-1996 | High energy, heavy ion nuclear microprobe for ion beam research on the tandem accelerator at ANSTO. | Cohen, DD; Siegele, R; Dytlewski, N |
| 15-Apr-2021 | iBAT: a new ion beam batch analysis tool for thin samples | Siegele, R; Cohen, DD |
| 1-Nov-2019 | IBIC microscopy – the powerful tool for testing micron – sized sensitive volumes in segmented radiation detectors used in synchrotron microbeam radiation and hadron therapies | Pastuovic, Z; Davis, J; Tran, LT; Paino, JR; Dipuglia, A; James, B; Povoli, M; Kok, A; Perevertaylo, VL; Siegele, R; Prokopovich, DA; Lerch, MLF; Petasecca, M; Rosenfeld, AB; Cohen, DD |
| Dec-2010 | Improved electromechanical sensitivity of polymer thin films containing carbon clusters produced in situ by irradiation with metal ions | Murugaraj, P; Mainwaring, DE; Khelil, NA; Peng, JL; Siegele, R; Sawant, P |
| 15-Jun-2009 | Improved resolution and sensitivity on the ANSTO microprobe and it's application to μ-PIXE | Siegele, R; Kachenko, AG; Ionescu, M; Cohen, DD |
| 25-Nov-2009 | Improved resolution on the ANSTO microprobe and its application | Siegele, R; Reinhard, MI; Ionescu, M; Kachenko, AG; Cohen, DD |
| 16-Sep-2013 | Influence of different mass absorption coefficient datasets on PIXE yields | Siegele, R; Cohen, DD |
| 1-Jul-2013 | Investigation of elemental changes in brain tissues following excitotoxic injury | Siegele, R; Howell, NR; Callaghan, PD; Pastuovic, Z |
| 15-Oct-2011 | Investigation of the mouse cerebellum using STIM and mu-PIXE spectrometric and FTIR spectroscopic mapping and imaging | Hackett, MJ; Siegele, R; El-Assaad, F; McQuillan, JA; Aitken, JB; Carter, EA; Grau, GE; Hunt, NH; Cohen, DD; Lay, PA |
