Please use this identifier to cite or link to this item: https://apo.ansto.gov.au/dspace/handle/10238/12856
Title: IBIC microscopy – the powerful tool for testing micron – sized sensitive volumes in segmented radiation detectors used in synchrotron microbeam radiation and hadron therapies
Authors: Pastuovic, Z
Davis, J
Tran, LT
Paino, JR
Dipuglia, A
James, B
Povoli, M
Kok, A
Perevertaylo, VL
Siegele, R
Prokopovich, DA
Lerch, MLF
Petasecca, M
Rosenfeld, AB
Cohen, DD
Keywords: Ion beams
Microscopy
Ionizing radiations
MeV range
Si semiconductor detectors
Semiconductor diodes
Therapy
Issue Date: 1-Nov-2019
Publisher: Elsevier B. V.
Citation: Pastuovic, Z., Davis, J., Tran, L. T., Paino, J. R., Dipuglia, A., James, B., Povoli, M., Kok, A., Perevertaylo, V. L., Siegele, R., Prokopovich, D., Lerch, M., Petasecca, M., Rosenfeld, A., & Cohen, D. D. (2019). IBIC microscopy – the powerful tool for testing micron – sized sensitive volumes in segmented radiation detectors used in synchrotron microbeam radiation and hadron therapies. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 458, 90-96. doi:10.1016/j.nimb.2019.08.003
Abstract: Ion Beam Induced Charge (IBIC) microscopy performed using highly tuned microbeams of accelerated ions with energies in the MeV range is the powerful tool for analysis of charge carrier transport properties in semiconductor devices based on semiconductor hetero-junction, metal-on-semiconductor and semiconductor-on-insulator configurations. Here we present two cases of recent applications of the IBIC microscopy in the field of medical radiation physics. The reduced-rate ion microbeams with energies in the MeV range and sub-micrometer spot-sizes have been used for the investigations of the charge collection efficiency (CCE) in sensitive volumes of segmented radiation detectors in order to measure the spatial distribution and uniformity of CCE in different polarization conditions. This information allows the determination of the charge carrier transport properties in selected substructures of a particular device and to quantify its ability to accurately determine the energy deposited by incident ionizing radiation - two fundamental requirements of any microdosimeter or detector of ionizing radiation. © 2019 Elsevier B.V.
URI: https://doi.org/10.1016/j.nimb.2019.08.003
https://apo.ansto.gov.au/dspace/handle/10238/12856
ISSN: 0168-583X
Appears in Collections:Journal Articles

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.