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Title: Study of oxygen incorporation in PLD MgB2 films by Rutherford backscattering spectroscopy
Authors: Zhao, Y
Ionescu, M
Dou, SX
Liu, HK
Keywords: Thin films
Rutherford backscattering spectroscopy
Issue Date: Jun-2007
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Citation: Zhao, Y., Ionescu, M., Dou, S. X., & Liu, H. K. (2007). Study of oxygen incorporation in PLD MgB2 films by Rutherford backscattering spectroscopy. IEEE Transactions on Applied Superconductivity, 17(2), 2875-2878. doi:10.1109/TASC.2007.899485
Abstract: The Rutherford backscattering (RBS) method has been employed to study the incorporation of oxygen into MgB2 films during their fabrication by pulsed-laser deposition (PLD). A series of MgB2 thin film samples were analyzed, including two films produced in situ on Al2O3 - c substrates (with higher T-c and lower T-c) with an on-axis geometry, one film produced in situ with an off-axis geometry, and one film produced ex situ, with a bulk-like T-c. The amount of oxygen detected by RBS, which is stable in the form of MgO, appears to be correlated with the T-c of the films, the higher the T-c the lower the oxygen content. The superconducting properties of the thin films are discussed in the context of the RBS results. © 2007, Institute of Electrical and Electronics Engineers (IEEE)
Gov't Doc #: 1150
ISSN: 1051-8223
Appears in Collections:Journal Articles

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