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https://apo.ansto.gov.au/dspace/handle/10238/313| Title: | Application of proton induced x-ray emission to the element analysis of thick obsidian samples |
| Authors: | Duerden, P Cohen, DD Clayton, E |
| Keywords: | Protons X-ray emission analysis ANSTO Emission spectroscopy Neutron activation analysis |
| Issue Date: | Nov-1979 |
| Publisher: | Australian Atomic Energy Commission |
| Citation: | Duerden, P., Cohen, D., & Clayton, E. (1979). The application of proton induced x-ray emission to the element analysis of thick obsidian samples (AAEC/E475). Lucas Heights, NSW: Research Establishment, Australian Atomic Energy Commission. |
| Abstract: | The proton induced x-ray emission (PIXE) technique has been applied to the analysis of element concentrations in obsidian source samples. No target preparation other than washing and the selection of a flat surface was undertaken. Thick target yields have been calculated and element concentrations derived from the detected X-ray spectra; concentrations are given for K, Ca, Ti, V, Mn, Fe, Ga, As, Rb, Sr, Y, Zr, Nb, Ta, and Pb. A pinhole filter is described which enables a single measurement of about 5 minutes duration to give element concentration data over an x-ray energy range 3-20 keV. |
| Gov't Doc #: | 190 |
| URI: | http://apo.ansto.gov.au/dspace/handle/10238/313 |
| ISBN: | 0642596794 |
| Appears in Collections: | Scientific and Technical Reports |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| AAEC-E-475.pdf | 575.45 kB | Adobe PDF |  View/Open |
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