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Title: Developing electronic devices capable of withstanding harsh radiation
Authors: Pastuovic, Z
Vittone, E
Siegele, R
Capan, I
Vizkelethy, G
Cohen, DD
Jakšić, M
Keywords: Radiation absorption analysis
Nondestructive analysis
Radiation hardening
Ionizing radiations
Semiconductor detectors
Solar cells
Electronic equipment
Issue Date: 13-May-2013
Citation: Pastuovic, Z., Vittone, E., Siegele, R., Capan, I., Vizkelethy, G., Cohen, D., & Jakšić, M. (2013). Developing electronic devices capable of withstanding harsh radiation. In Australian Nuclear Science and Technology Organisation (Ed.) Research Selections 2013 (pp.34-43). Lucas Heights, NSW: Australian Nuclear Science and Technology Organisation.
Abstract: Studies performed by Zeljko Pastuovic at ANSTO’s microprobe facility, in collaboration with a team of international researchers, are helping to understand, model and predict the detrimental influence of ionising radiation on semiconducting materials required in millions of electronic devices. The research aims to develop materials and devices that are able to better withstand the damaging effects of high energy particles present in harsh radiation environments, such as solar cells, and power satellites in space, as well as materials used in high-energy physics and accelerators. These studies will help semiconductor, aerospace and other industries to better understand and extend the life of electronic devices.
Gov't Doc #: 6340
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