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https://apo.ansto.gov.au/dspace/handle/10238/7759| Title: | Characterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scattering |
| Authors: | Pelliccia, D Andrei, YN Kirby, N Hester, JR |
| Keywords: | X-ray diffraction Data Morphology Validation Scattering Particles |
| Issue Date: | 2014 |
| Publisher: | InderScience Publishers |
| Citation: | Pelliccia, P., Nikulin, A. Y., Kirby, N., & Hester, J. (2014). Characterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scattering. International Journal of Nanotechnology, 11(5-8), 549-554. doi:10.1504/IJNT.2014.060576 |
| Abstract: | We report on the characterisation of embedded Al2Cu nanoparticles in Al matrix by X-ray diffraction imaging and small-angle X-ray scattering. We employed direct retrieval of the average morphological characteristics of the nanoparticles from their diffraction pattern. Data suggest the possibility of acquiring truly 3D information with X-ray diffraction imaging. Validation of the results obtained with small-angle X-ray scattering is reported. © 2020 Inderscience Enterprises Ltd. |
| Gov't Doc #: | 7321 |
| URI: | http://dx.doi.org/10.1504/IJNT.2014.060576 http://apo.ansto.gov.au/dspace/handle/10238/7759 |
| ISSN: | 2056-4058 |
| Appears in Collections: | Journal Articles |
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