Grazing incidence x-ray studies of ultra-thin lumogen films.

Abstract

Lumogen® Yellow S0790 films have been produced on silicon wafer substrates via physical vapour deposition (PVD) and spin-coating (SC) methods. These coatings were characterised with X-ray reflectometry (XRR) and grazing incidence X-ray diffraction (GIXD) techniques. The results show that ultra-thin (less than 12nm) PVD films coat amorphously, with crystallinity becoming increasingly apparent with increasing film thickness. In contrast, measurements of ultra-thin (less than 2nm) spin-coated films reveal a second, apparently stable crystalline structure. © 2007, Elsevier Ltd.