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Issue Date	Title	Author(s)
Sep-1980	Transient capacitance measurements of deep level defects introduced in y-ray compensated germanium by long-term annealing at room temperature	Pearton, SJ; Williams, AA; Tavendale, AJ; Lawson, EM
Feb-1983	An attempt to detect electrochemical doping of silicon with arsenic by Rutherford backscattering analysis	Tavendale, AJ; Lawson, EM