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Issue Date	Title	Author(s)
Sep-1983	Search for an anomalous near-surface yield deficit in Rutherford backscattering spectra from implanted germanium and silicon	Lawson, EM; Williams, JS; Chivers, DJ; Short, KT; Appleton, BR
Feb-1983	An attempt to detect electrochemical doping of silicon with arsenic by Rutherford backscattering analysis	Tavendale, AJ; Lawson, EM
Jun-1983	A method for annealing ion-implanted silicon on a vitreous carbon strip heater	Lawson, EM