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Issue DateTitleAuthor(s)
27-Nov-2005Neutron reflectivity and atomic force microscopy studies on the effect of pH and solubilizate upon the structure of adsorbed cationic surfactant films on quartzSchulz, JC; Nelson, A; Blom, ACM; War, GG
27-Nov-2005Neutron diffraction study of domain structures in poled and unpoled PZN–4.5%PTPiltz, RO
27-Nov-2005Comparative study of neutron reflectometry, x-ray reflectometry and electrical impedance spectroscopy of organic films on siliconWong, ELS; James, M; Coster, HGL; Chilcott, TC
27-Nov-2005Influence of cation ordering on octahedral tilting in perovskitesZhang, Z; Howard, CJ; Carpenter, MA; Knight, KS

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