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Issue DateTitleAuthor(s)
Nov-2007ANSTO heavy ion ToF for analysis of light elements in thin filmsIonescu, M; Zhao, Y; Siegele, R; Cohen, DD; Lynch, D; Garton, D; Stelcer, E; Prior, MJ
Nov-2007Towards a better understanding and prediction of the bremsstrahlung background in PIXE spectraCohen, DD; Stelcer, E; Prior, MJ; Siegele, R; Ionescu, M
Apr-2008Doiba manual: using PIXE and PIGE to their full potential with doibaSiegele, R; Ionescu, M; Cohen, DD
Nov-2007Localisation of trace metals in hyperaccumulating plants using μ-PIXESiegele, R; Kachenko, AG; Wang, YD; Ionescu, M; Bhatia, NP; Cohen, DD
25-Nov-2009A bright future for accelerator science at ANSTOHotchkis, MAC; Child, DP; Cohen, DD; Dodson, JR; Fink, D; Garton, D; Hua, Q; Ionescu, M; Jacobsen, GE; Levchenko, VA; Mifsud, C; Siegele, R; Smith, AM; Williams, AG; Winkler, S
7-Feb-2006The role of multilayering in the significant improvement of structural and superconducting properties in high-Tc filmsPan, AV; Pysarenko, SV; Roussel, M; Dou, SX; Ionescu, M
25-Nov-2009Improved resolution on the ANSTO microprobe and its applicationSiegele, R; Reinhard, MI; Ionescu, M; Kachenko, AG; Cohen, DD

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